Measurement of Refractive Indices of CdSiP2 at Temperatures from 90 to 450 K (Postprint)
Journal Article - Open Access
UES, Inc. Dayton United States
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Ordinary and extraordinary refractive indices of CdSiP2 were measured and a Sellmeier equation was obtained, for the first time to our knowledge over the temperature range 90 to 450 K. The index values were used to calculate the crystal temperature and phase-matching angle dependence of the generated wavelengths in nonlinear frequency conversion of a range of pump wavelengths. A good match was obtained between the calculated values of the wavelengths and some experimental measurements.