Generation of Controlled Analog Emissions from Embedded Devices using Software Stress Methods
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In this paper, we present a new method that uses software diagnostic tools to study the generation of induced spurious physical emissions from embedded devices over air-gapped remote channels. With this methodology, spurious emissions are induced during controlled computer operations such as dynamic memory allocation, hard disk writing and computations. Each stressing operation creates a pulse in an amplitude shift keying scheme. These software techniques can provide repeatable measurements of embedded devices for mapping unwanted emissions over air-gapped channels.
- Electrical and Electronic Equipment
- Test Facilities, Equipment and Methods
- Radiofrequency Wave Propagation