Accession Number:

AD1025397

Title:

Scalable Testing Platform for CMOS Read In Integrated Circuits

Descriptive Note:

Conference Paper

Corporate Author:

University of Delaware Newark United States

Report Date:

2016-03-31

Pagination or Media Count:

4.0

Abstract:

The read-in integrated circuit RIIC is an integrated circuit that drives an array of infrared emitters inside of an infrared scene projector IRSP system. We have designed different RIICs for four future IRSP systems that are being built by our research group. This paper describes a single scalable testing platform STP capable of testing all of our RIICs. This approach reduces the design time and risk associated with RIIC testing. On the hardware side, our platform consists of several custom printed circuit boards. On the software side, our platform consists of a single code base.

Subject Categories:

Distribution Statement:

APPROVED FOR PUBLIC RELEASE