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Acquire an Bruker Dimension FastScan (trademark) Atomic Force Microscope (AFM) for Materials, Physical and Biological Science Research and Education

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Technical Report

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Clark Atlanta University Atlanta United States

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The DOD HBCUMI instrumentation award provided us a rare opportunity to acquire a Bruker Dimension FastScanTM Atomic Force Microscope AFM in 2015. The AFM instrument was installed in June 2015 and is greatly promoting our scientific research work and education programs. The Dimension FastScan allows scanning 10-20X faster than the traditional Icon scanner. Because of the scanning rates the AFM will permit us to study dynamic events such as melting, evaporation, crystallization, dissolution, self-assembly, membrane disruption, sample movement tracking. To ensure that the state-of-the-art AFM is appropriately utilized by members of the Clark AtlantaUniversity scientific community, two super users, Drs. Biswajit Sannigrahi and Guangchang Zhou were trained by the Senior Engineer forProduct Service, Dr. Teddy Huang from the Bruker Nano Surface Division during the course of 4-day installationtraining from June 8 to 11,2015. They not only mastered the basic manipulation, troubleshooting and routine maintenance of the AFM instrument, but also were familiar with the other different modes of operation mechanical, electrical, thermal, fluid imaging. The AFM is currently being utilized by several students to study the self-assembly of hairy nanoparticles and block copolymers. The Dimension FastScan AFM as a new nanotoolis boosting our research work and education programs.

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  • Optics

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