Gaining Insight Into Femtosecond-scale CMOS Effects using FPGAs
University of Southern California, Information Sciences Institute Arlington United States
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Reliability data and accurate compact models for new semiconductor processes are often very expensive to obtain. This paper considers low-cost collection of empirical data using COTS FPGAs and novel self-test. Hardware experiments using a 28 nm FPGA demonstrate isolation of small sets of transistors, detection of subtle aging, and measurement precision more than 10 finer 3060 femtoseconds than state of the art.
- Electrical and Electronic Equipment