Accession Number:

AD1022833

Title:

Gaining Insight Into Femtosecond-scale CMOS Effects using FPGAs

Descriptive Note:

Conference Paper

Corporate Author:

University of Southern California, Information Sciences Institute Arlington United States

Personal Author(s):

Report Date:

2015-03-24

Pagination or Media Count:

4.0

Abstract:

Reliability data and accurate compact models for new semiconductor processes are often very expensive to obtain. This paper considers low-cost collection of empirical data using COTS FPGAs and novel self-test. Hardware experiments using a 28 nm FPGA demonstrate isolation of small sets of transistors, detection of subtle aging, and measurement precision more than 10 finer 3060 femtoseconds than state of the art.

Subject Categories:

  • Electrical and Electronic Equipment

Distribution Statement:

APPROVED FOR PUBLIC RELEASE