Benchtop Transmission Electron Microscope (TEM) with Electron Diffraction (ED) and Scanning Electron Microscopy (SEM) Capabilities for Analysis of Inorganic Solution-Processed Flexible Solar Cells
Technical Report,01 Feb 2014,31 Jan 2015
Delaware State University Dover United States
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The award W911NF-14-1-0071 made to Delaware State University enabled the acquisition of a benchtop low-voltage Transmission Electron Microscope TEM with Scanning Electron Microscope SEM Capability LV EM 5. The instrument acquisition supports Analysis of Inorganic Solution-Processed Flexible Solar Cells and has been used to accomplished the project objectives 1. Support the project Novel Thin-Film Photovoltaic Technologies Using Solution Nano-Precursors to Cu2ZnSnS4, Fe2SiS4, andFe2GeS4-Based Absorber Layers, research ongoing in Dr. Daniela Radus PI laboratory. 2. Build strength in nanotechnology-related research and education at DSU. The project resulted in two presentations at the National American Chemical Society Meeting, March 20-24, 2015 in Denver, CO. The instrument was critical to achieve high throughput analysis of nanoparticles used in solution processed thin-films. The LV EM 5 has been used in TEM mode for nanoparticles size screening. SEM mode has been used to identify silica nanostructure morphologies and packing on a analysis stub. Three students and two faculty members have been trained and are using the instrument since installation and training sessions in November2014.
- Test Facilities, Equipment and Methods