Accession Number:

AD0904603

Title:

(Hg,Cd)Te High Reliability.

Descriptive Note:

Final technical rept. Oct 71-May 72,

Corporate Author:

HONEYWELL RADIATION CENTER LEXINGTON MA

Personal Author(s):

• Robillard, G. A.

Report Date:

1972-06-30

Pagination or Media Count:

48.0

Abstract:

This final report describes the design and responsive parameters of ten high reliability single element Hg,CdTe detector devices. The infrared sensors, designated by Honeywell Part Number DLK13G1 are optimized for detectivity in the 8 to 14-micron spectral region. The units, with exception of final pump bake temperature, were fabricated as standard high reliability product line devices. In addition to achieving high performance, the goal was to provide devices capable of high temperature storage and vacuum integrity. With no firm program objective, efforts were directed at meeting the temperature vs altitude operational requirements for class 1 equipment of MIL-STD-810B. The program has been successful. The detectors exhibited performance in excess of the minimum requirements. Sound process techniques were applied for conformance to MIL-STD-810B. Author

Descriptors:

• (*INFRARED DETECTORS
• RELIABILITY(ELECTRONICS))
• MERCURY ALLOYS
• CADMIUM ALLOYS
• TELLURIDES
• MANUFACTURING
• QUALITY CONTROL

Subject Categories:

• Infrared Detection and Detectors

Distribution Statement:

APPROVED FOR PUBLIC RELEASE