Dielectric Spectroscopy of High-Temperature Materials
Final technical rept. 1 Feb 1970-31 Jan 1971
MASSACHUSETTS INST OF TECH CAMBRIDGE LAB FOR INSULATION RESEARCH
Pagination or Media Count:
Measuring techniques for extending dielectric-constant and loss measurements to liquid-nitrogen temperature at 10 MHz, to 2000C at 100 MHz, and to 1600C at 90 GHz are discussed. High-temperature measurements on spinel and sapphire are included in the dielectric data accumulated during this contract. Programs in Fortran IV are given for the general standing-wave method calculations and for covered high-loss samples one-quarter wavelength from the end of hollow waveguide.
- Test Facilities, Equipment and Methods
- Solid State Physics