Failure Analysis of Minuteman Integrated Circuit Failures.
Final technical rept. 1 Oct 68-15 Dec 69,
AUTONETICS ANAHEIM CA
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The report describes experience in determining the actual reliability of Minuteman integrated circuits. The device constructions and evolution are discussed in terms of the materials, design, testing, and failure analysis of these circuits. System failures are shown to occur because of either improper device designs or inefficient inspections and testing. Author
- Electrical and Electronic Equipment