Accession Number:

AD0869638

Title:

Quality Verification Test Report on Semiconductor, Transistor, Field Effect, Silicon, N-Channel, Planar, Metal Can.

Descriptive Note:

Corporate Author:

NAVAL WEAPONS CENTER CHINA LAKE CA

Personal Author(s):

Report Date:

1969-08-29

Pagination or Media Count:

96.0

Abstract:

The purpose of the test report is to discuss the results of the Quality Verification Tests which were performed on a sample of 128 units to determine their conformance to NAVAIR Drawing Number 2604664. Author

Subject Categories:

  • Electrical and Electronic Equipment

Distribution Statement:

APPROVED FOR PUBLIC RELEASE