The Critical Current of Superconducting Tin and Indium,
NAVAL ORDNANCE LAB WHITE OAK MD
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The critical current densities in planar superconducting films of tin and indium were measured as a function of temperature. Both tin and indium films were evaporated on glass substrates at 80 degrees K and were annealed to temperatures below 200 degrees K. The measurements are evaluated in the light of estimates of the stability of the superconducting state against a transition into the intermediate state before the depairing maximum in the current density is reached. The influence of the structure of the films on their current carrying capacity was studied. In coarse crystalline tin films which have a mean thickness of about 1000 A, the critical current becomes temperature independent below a certain temperature. The critical current is found to be higher in the presence of pin holes than it is in relatively defect-free films.
- Electricity and Magnetism
- Solid State Physics