Failure Rate Prediction for Complex Bipolar Microcircuits
Technical Report,01 May 1968,31 May 1969
ROME AIR DEVELOPMENT CENTER GRIFFISS AFB NY GRIFFISS AFB United States
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The intent of this report is to provide a reliability prediction technique for complex bipolar microcircuits, commonly referred to as small-, medium-, and large-scale integration. Failure mode distributions for complex microcircuits are projected from failure mode data on standard integrated circuits. This is done by the use of failure mode multipliers which are determined by linear extrapolations from a representative breakdown of composite industry-wide failure mode data on current state-of-the-art integrated circuits. The failure rate prediction model for standard integrated circuits is extended to cover these new complex circuits. To achieve this, an additional term, to account for the variations in processing and fabrication of complex microcircuit arrays, is introduced into the standard model along with the standard multipliers which have been extended or altered according to the number of gates, packaging configuration, and increased silicon chip area. The base failure rate for standard circuits will also be used as the basis of the new prediction technique. Optimum failure rates are calculated for some typical complex circuits and compared to the failure rate of their discrete integrated circuit equivalent.