Reliability Characterization and Prediction of Integrated Circuits.
Interim technical rept. 20 Sep 68-20 Mar 69,
BOEING AEROSPACE CO SEATTLE WA
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The objective of the program is to develop analytical techniques for reliability characterization and prediction of integrated circuits for use by USAF project engineers and contractors in reliability design and evaluation of USAF microelectronic equipments. To accomplish the objective a comprehensive study will be made of principal factors that influence the failure rate of integrated quality control, screening, application, and cost. Author
- Electrical and Electronic Equipment