Reliability Prediction and Demonstration for Ground Electronic Equipment
Final rept. 24 Apr 1967-24 May 1968
TRW SYSTEMS GROUP REDONDO BEACH CA
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This study evaluates the accuracy of pre-design and stress analysis reliability prediction techniques, including the RADC Reliability Notebook, Volume II, stress analysis method, when applied to a variety of ground electronic equipment. Sources of prediction inaccuracy are investigated and identified. Program-related factors significant to the achievement of reliability and prediction accuracy are identified and a quantitive rating system is established and related to system prediction accuracy. New and improved pre-design and stress analysis reliability prediction methods are developed and tested. Equipment design approach categories having different prediction accuracy characteristics are identified with statistical distributions of prediction accuracy ratios. Degradation analysis processes and techniques are identified, evaluated, and presented with a recommended approach for their application. Reliability demonstration methods, including the Bayesian approach, are evaluated. A recommended reliability demonstration approach for ground electronic equipment is developed. A new base for integrated circuit failure tests is also provided.
- Manufacturing and Industrial Engineering and Control of Production Systems