Accession Number:

AD0844360

Title:

Development and Implementation of Reliability Analysis Center. Volume 1. Sections 1-7

Descriptive Note:

Final rept. 15 Jun 1967-15 Jul 1968

Corporate Author:

IIT RESEARCH INST CHICAGO IL

Report Date:

1968-10-01

Pagination or Media Count:

239.0

Abstract:

The Reliability Analysis Center is being established as a Department of Defense Data Center for the collection, analysis, and dissemination of technical information on microelectronic device reliability. Its objective is to establish a basis for correlating reliability factors with device materials, design, fabrication, quality assurance and application factors. This report describes the development, implementation, and present status of a data collection and file entry effort supplemented by a Termetrex data retrieval system. Detailed operating procedures, periodic outputs, and user services from the Center are described in detail. Future plans call for expansion of RAC into hybrid microelectronics and discrete semiconductors used in military weapons and communications systems.

Subject Categories:

  • Electrical and Electronic Equipment
  • Manufacturing and Industrial Engineering and Control of Production Systems

Distribution Statement:

APPROVED FOR PUBLIC RELEASE