Accession Number:

AD0843589

Title:

Tube Failure Mechanisms.

Descriptive Note:

Quarterly rept. no. 1, 1 May-31 Jul 68,

Corporate Author:

RAYTHEON CO WALTHAM MA MICROWAVE AND POWER TUBE DIV

Personal Author(s):

• Bouchard, Kenneth G.

Report Date:

1968-10-14

Pagination or Media Count:

47.0

Abstract:

A survey of the literature on electrical breakdown in a vacuum and across dielectric surfaces was conducted, and a computer program to calculate field emission and associated quantities was written. The experience gained through last years Internal Arc Inhibition Program is summarized and the vacuum system, test chamber, and associated electronics are described. A test procedure was developed and modified during the testing of the following set of electrodes 1 gap breakdown set, 2 uncoated surface breakdown sets, and 4 titanium-coated surface breakdown sets. For the latter sets, the same process was used as on microwave windows. Author

Descriptors:

• *ELECTRON TUBES
• *COMPUTER PROGRAMS
• FAILURE(ELECTRONICS)
• EMISSIVITY
• MICROWAVE FREQUENCY
• ELECTRIC DISCHARGES
• DIELECTRICS
• ELECTRODES
• FIELD EMISSION
• SURFACE PROPERTIES
• COPPER
• ELECTRICAL INSULATION
• ELECTRON TUBE COMPONENTS

Subject Categories:

• Electrical and Electronic Equipment
• Computer Programming and Software
• Electricity and Magnetism

Distribution Statement:

APPROVED FOR PUBLIC RELEASE