RESEARCH AND DEVELOPMENT INTRINSIC RELIABILITY SUBMINIATURE CERAMIC CAPACITORS
Interim progress rept. no. 18, 1 Aug 1967-31 Jan 1968
SPRAGUE ELECTRIC CO NORTH ADAMS MA
Pagination or Media Count:
The 20,000 - hour, voltagetemperature life test matrix, which involved the 0.01 microfarad C67 Case Size 1 MONOLYTHIC trade name capacitor, is discussed. Frequency histograms of all leakage current data and Weibull determinations of failure rates for some of the test conditions are included. In addition, the criteria which determined short-life capacitors during testing are presented, as well as a comparison of calculated assured life times with the times to actual life test failures. Finally, the schedule and conditions for a second voltagetemperature life test matrix using 0.033 microfarad C67 device are briefly summarized.
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