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Accession Number:
AD0838462
Title:
AUTOMATIC AND MANUAL INTEGRATED CIRCUIT TEST EQUIPMENT
Descriptive Note:
Corporate Author:
NEW YORK UNIV NY ENGINEERING RESEARCH DIV
Report Date:
1968-08-01
Pagination or Media Count:
50.0
Abstract:
The report presents a brief discussion on the various instruments in use today for electrical testing of integrated circuits. A tabulation of commercially available manual and automatic testers is included.
Distribution Statement:
APPROVED FOR PUBLIC RELEASE