EFFICIENT TESTING OF COMBINATIONAL LOGIC CELLS IN LARGE-SCALE ARRAYS.
STANFORD UNIV CA STANFORD ELECTRONICS LABS
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The research investigates the characteristics that regular cellular arrays must have in order that each cell can be tested from the peripheral terminals of the array. The nominally identical cells in the array have n inputs and n outputs, where each of the n outputs is some combinational function of the n input variables of the cell. Of special interest is the characterization of cells and arrays in order to predict whether defective cells can be not only tested but also located within the array. Author
- Electrical and Electronic Equipment