Accession Number:

AD0836041

Title:

FORMATION OF THIN-FILM PASSIVE DEVICES BY VACUUM TECHNIQUES,

Descriptive Note:

Corporate Author:

MELPAR FALLS CHURCH VA

Personal Author(s):

Report Date:

1965-05-23

Pagination or Media Count:

150.0

Abstract:

In the period of April 19 through April 23, 1965, three U.S. Naval Avionics Facility NAFI personnel were given detailed instruction on the techniques and instructions applicable to the formation and characterization of passive devices. Details of the equipment, materials, vendors, deposition procedure, monitoring techniques and device characterization were given by Melpar personnel. Articles covering much of the passive device work carried out at Melpar were furnished to NAFI personnel. Approximately 130 extreme environment capacitors and 90 resistors were formed under the observation of NAFI personnel. Of the devices formed, approximately 50 of the capacitors met desired specifications and 50 of the resistors met the design objectives. Of the capacitors, approximately 90 were useful at somewhat lower temperatures than those called for in the specifications. List of key words denoting principal coverage of report 1 Borosilicate Capacitors 2 Dysprosium Oxide Capacitors 3 Evaporated Thin-Films 4 Rhenium Resistors 5 Thin-Film Passive Devices 6 Vacuum Deposition Techniques. Author

Subject Categories:

  • Electrical and Electronic Equipment
  • Fabrication Metallurgy

Distribution Statement:

APPROVED FOR PUBLIC RELEASE