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INVESTIGATION OF RELIABILITY TESTING AND PREDICTION TECHNIQUES FOR INTEGRATED CIRCUITS EXTENSION B.
Final rept. 1 Jan-1 Jul 67,
TEXAS INSTRUMENTS INC DALLAS
Pagination or Media Count:
The work was conducted to verify a reliability screening procedure for the SN5420 Integrated Circuit. Results of the tests and analyses conducted during the evaluation of this procedure indicate that changes to the procedure were necessary to screen for failure modes encountered for the first time in the contract during Extension B tests. The recommended new screening procedure contains all the previous stress and inspection techniques but in a modified sequence. The most significant change, incorporation of 300C storage prior to lot capsulation, is recommended to improve the effectiveness of the 100 die inspection screen. Author
APPROVED FOR PUBLIC RELEASE