RADIATION EFFECTS IN DIELECTRIC MATERIALS.
Annual rept. no. 9, 1 Sep 66-15 Nov 67,
GULF GENERAL ATOMIC CO SAN DIEGO CA
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Induced conductivity in several substrate materials was measured during high-energy electron irradiation. Materials irradiated were Pyrex, glass, fused quartz, single-crystal quartz, polycrystalline aluminum oxide, and sapphire. Sapphire exhibited induced conductivity one to two orders of magnitude larger than the other materials and also showed strong polarization effects to a much greater extent than the other samples. Induced conductance between electrodes on one side of a substrate again indicated larger induced conductance in sapphire and large polarization effects compared with Pyrex. Several thin-film silicon monoxide capacitors were irradiated to observe the induced response and evaluate the induced conductivity coefficients. Irradiation of two types of integrated circuits, one a conventional type with reverse-biased diode isolation and the other with dielectric isolation , demonstrated the effectiveness of dielectric isolation in reducing the transient signals at the output without evidence of polarization effects or delayed conductivity in the dielectric adversely affecting the output. An experiment with a Mylar capacitor indicated linear response of the prompt conductivity with dose rate and dose over the range of 10 to the 7th power to 3 x 10 to the 9th power rads Sisec and 15 to 8 x 10 to the 3rd power rads Si, respectively. Author
- Electrical and Electronic Equipment
- Radioactivity, Radioactive Wastes and Fission Products