TRANSIENT HEAT TRANSFER MEASUREMENT WITH THIN-FILM RESISTANCE THERMOMETERS--DATA REDUCTION TECHNIQUES
Final rept. Apr-Sep 1967
CORNELL AERONAUTICAL LAB INC BUFFALO NY
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An account is presented of experimental studies of techniques of data reduction required to convert measurements obtained with thin-film resistance thermometers to incident heating rates. Emphasis is on development of practical data reduction techniques accommodating nonspecific gage surface temperature histories as well as temperature excursions sufficiently large to necessitate correction for variable thermal properties of the gage. Analog computer solutions were obtained for a range of surface temperature functions representative of phenomena observed in actual shock tunnel operations. The mathematical formulation used in the analog studies was adapted to the development of an economical and general digital data reduction program. A description is given of the operation and design details of a compensated analog circuit which operates directly on the electrical output of the thin-film gage to provide an output signal proportional to the true heating rate.
- Test Facilities, Equipment and Methods