ACCELERATED TESTING OF HIGH RELIABILITY PARTS. VOLUME I.
Final technical documentary rept. 17 Dec 65-17 Dec 66,
GENERAL ELECTRIC CO PHILADELPHIA PA MISSILE AND SPACE DIV
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Long term tests to 30,000 hours were continued to provide correlation data for accelerated test results. A theory of life governing processes for electronic parts is given. The data are analyzed and presented to provide estimates of the life governing processes for each part type. A physics of failure study of mica, ceramic, porcelain, and glass capacitors was also performed and the results are included. Author
- Electrical and Electronic Equipment