Accession Number:

AD0815272

Title:

RADIATION EFFECTS ON ELECTRONIC PARTS AND MATERIALS.

Descriptive Note:

Quarterly rept. no. 2, 15 Sep-14 Dec 66,

Corporate Author:

IBM FEDERAL SYSTEMS DIV OWEGO NY ELECTRONICS SYSTEMS CENTER

Personal Author(s):

Report Date:

1967-03-01

Pagination or Media Count:

38.0

Abstract:

An analytical study was made for optimum methods and approaches to extract dielectric parameters to characterize capacitors which are subjected to intense short duration gamma ray pulses. These methods are being used to analyze data obtained from recent tests conducted at the advanced flash X-ray AFXR source at Physics International, San Leandro, California. Author

Subject Categories:

  • Radioactivity, Radioactive Wastes and Fission Products

Distribution Statement:

APPROVED FOR PUBLIC RELEASE