RADIATION EFFECTS ON ELECTRONIC PARTS AND MATERIALS.
Quarterly rept. no. 2, 15 Sep-14 Dec 66,
IBM FEDERAL SYSTEMS DIV OWEGO NY ELECTRONICS SYSTEMS CENTER
Pagination or Media Count:
An analytical study was made for optimum methods and approaches to extract dielectric parameters to characterize capacitors which are subjected to intense short duration gamma ray pulses. These methods are being used to analyze data obtained from recent tests conducted at the advanced flash X-ray AFXR source at Physics International, San Leandro, California. Author
- Radioactivity, Radioactive Wastes and Fission Products