AN INVESTIGATION ON AN ELECTRONICALLY CONTROLLABLE MICROWAVE WINDOW.
Quarterly rept. no. 3, 28 Oct 66-27 Jan 67,
RENSSELAER POLYTECHNIC INST TROY N Y DEPT OF ELECTRICAL ENGINEERING
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The main objective of this research study is to develop an electronically controllable S-band microwave silicon window in order to overcome some of the limitations of junction-type diodes in microwave switching applications. The modifications made on our high power S-band test facility, for achieving higher accuracy in small loss measurements, are described. The results of microwave tests performed on the previously designed windows of different resistivities, are presented. Graphs are given which show the spatial distribution of the injected excess carrier density in the window structure for several values of surface recombination velocity. The allowed depths of the p and n diffused layers for an efficient performance of the window are determined. An account is given of the laboratory procedure followed for the fabrication of the p-i-n silicon window structure.
- Electrical and Electronic Equipment