Accession Number:

AD0814988

Title:

MICROWAVE ELECTRONICALLY VARIABLE ION BEAM TIME DELAY DEVICE STUDY.

Descriptive Note:

Interim rept. no. 3, Dec 66-Feb 67,

Corporate Author:

MICROWAVE ASSOCIATES INC BURLINGTON MA

Personal Author(s):

Report Date:

1967-04-01

Pagination or Media Count:

66.0

Abstract:

Studies conducted this quarter on the ion-beam variable delay line are reported. Emphasis is placed on the ion sources and coupler theory and test. High percentage active material emitters sintered at 1400 C appear to give longer life the life test behavior of ion current emission can be approximately explained by diffusion of active material from a finite slug. Secondary electron emission due to ion bombardment of metals has also been investigated. A threshold ion energy is found and the emission appears to be governed by the alkali-atom coverage of the metals. No significant yield is found for ions of about 500 eV energy. Ion beams of density 4-5 mAsq cm have been extracted from a plasma, with a spreading governed by space charge neutralization and ion-atom collisions. The coupler theory is summarized as a coupling matrix, with numerical results included. Oscillation in a 10-gap coupler is found to be unlikely. Additional tests on the 50 MHz coupler have been performed. Conclusions and future plans are given. Author

Subject Categories:

  • Electrical and Electronic Equipment
  • Radio Communications

Distribution Statement:

APPROVED FOR PUBLIC RELEASE