FREQUENCY TEMPERATURE COMPENSATION TECHNIQUES FOR QUARTZ CRYSTAL OSCILLATORS.
Quarterly rept. no. 11, 1 Mar-31 May 66,
BENDIX CORP DAVENPORT IA PIONEER-CENTRAL DIV
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The purpose of this project is to develop design techniques for three groups of compensated crystal oscillators operating in the frequency range of 1 to 20 MHz with design goal frequency temperature stabilities of plus or minus 1 x 0.0000001 and plus or minus 5 x 10 to the minus 8th power over specified ambient temperature ranges as given in SCL-6657, dated 13 October 1964. With the completion of Group II oscillator effort, this program was directed toward the Group III design requirements. An initial objective was to establish a specific work plan for the hardware development. Resulting from this over-all study was the decision to employ microcircuit techniques in the design of the Group III oscillators. The need for accumulating more extensive test data on long term effects on the frequency vs. temperature characteristics of compensated oscillators led to the formulation of a detailed test program involving periodic measurement of all oscillator elements to detect changes in electrical parameters and relate these changes to subsequent performance degradation. Eight oscillators were fabricated for this purpose using the basic Group II design. Component parameter considerations resulted in procedures designed to accelerate the aging process of crystals to attain low aging rates and to measure precisely the temperature characteristics of standard thermistors to obtain better input data for computer programs. Author
- Electrical and Electronic Equipment
- Manufacturing and Industrial Engineering and Control of Production Systems