Accession Number:

AD0787620

Title:

Transient Upset Toleration as an EMP Hardening Technique.

Descriptive Note:

Topical rept.,

Corporate Author:

R AND D ASSOCIATES MARINA DEL REY CA

Personal Author(s):

Report Date:

1974-08-05

Pagination or Media Count:

26.0

Abstract:

Both transient circuit upset and permanent component damage can produce serious malfunctions in modern electronics equipment. Although the issue is not yet clear, it may be possible to design and select components which have a much higher threshold to permanent damage than to transient upset. If this proves to be possible, then a degree of electromagnetic pulse EMP hardness would be achieved through designing systems to be completely insensitive to the effects of transient circuit upset. In the paper, the characteristics of the developed techniques for tolerating transient upset are described, various overall system design approaches are discussed, and the relation of specific upset toleration techniques to the system design approaches are illustrated. Modified author abstract

Subject Categories:

  • Electromagnetic Pulses

Distribution Statement:

APPROVED FOR PUBLIC RELEASE