Stress Wave Measurements in a High Noise Environment.
Final rept. Oct 72-Dec 73,
KTECH CORP ALBUQUERQUE N MEX
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Thin flyers accelerated by magnetic repulsion have been used extensively for studying the response of materials to shock-wave and structural loadings. Analysis of the resulting behavior requires experimental parameters to be actively monitored and recorded. Measurement of the stress loading introduced into the sample and the resulting transmitted profile has been limited due to the severe electrical and shock environment of the tests. This document outlines the modification of an existing carbon gauge concept to allow its use in high electrical noise environment. Data are presented as stress versus time history of several types of experimental configuration. Included is a brief analysis showing correlation between theoretical and experimental data. Modified author abstract
- Test Facilities, Equipment and Methods