Radiation Hardening of Linear Microcircuits by Terminal Photocompensation.
Final rept. 15 Apr 72-1 Aug 73,
NORTHROP RESEARCH AND TECHNOLOGY CENTER HAWTHORNE CALIF
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The feasibility of using terminal photocompensation to reduce the ionizing-radiation vulnerability of linear microcircuit amplifiers is investigated. An analytical basis for terminal photocharge compensation is presented. Linear terminal models are developed for four types of integrated circuit amplifiers and are used to analyze the qualitative effects of terminal photocompensation. Experimental results show that two of the four microcircuits can be photocompensated with at least an order-of-magnitude reduction in the radiation-induced noise energy for several cases of external circuit configuration and radiation intensity. Author
- Electrical and Electronic Equipment