Microcircuit Device Environmental Data.
IIT RESEARCH INST CHICAGO ILL RELIABILITY ANALYSIS CENTER
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The tabulation contains environmental test results which are organized and presented by device manufacturer and part numbers. It provides, for each entry, a description of the device function, technology, package type, screen level and manufacturing date date code, in addition to the applied environmental conditions. Percent defective statistics and failure modesmechanisms are reported. The compendium is updated in its entirety and reissued annually. Author
- Electrical and Electronic Equipment