Accession Number:

AD0785126

Title:

Dynamic Analysis of MNOS Memory Devices.

Descriptive Note:

Master's thesis,

Corporate Author:

AIR FORCE INST OF TECH WRIGHT-PATTERSON AFB OHIO SCHOOL OF ENGINEERING

Personal Author(s):

Report Date:

1974-06-01

Pagination or Media Count:

95.0

Abstract:

The study determines and demonstrates the feasibility of using the Macrodata MD-104 Test System for analysis of MNOS memory devices. The MD-104 Test System is a high-speed automatic unit designed to test semiconductor memories. The processor of this system regards the device under test as a logical black box, and the conditions that are particular to the device being tested are established on an interface board called a personality card. A personality board was designed for the National Cash Register 1105 Electrically Alterable Read Only Memory. The NCR 1105 employs MNOS memory transistors in the memory array. The MD-104 Test System was used with the personality board to test the D.C. and A.C. operating characteristics of the NCR 1105 memory. Author

Subject Categories:

  • Computer Hardware

Distribution Statement:

APPROVED FOR PUBLIC RELEASE