Dynamic Analysis of MNOS Memory Devices.
AIR FORCE INST OF TECH WRIGHT-PATTERSON AFB OHIO SCHOOL OF ENGINEERING
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The study determines and demonstrates the feasibility of using the Macrodata MD-104 Test System for analysis of MNOS memory devices. The MD-104 Test System is a high-speed automatic unit designed to test semiconductor memories. The processor of this system regards the device under test as a logical black box, and the conditions that are particular to the device being tested are established on an interface board called a personality card. A personality board was designed for the National Cash Register 1105 Electrically Alterable Read Only Memory. The NCR 1105 employs MNOS memory transistors in the memory array. The MD-104 Test System was used with the personality board to test the D.C. and A.C. operating characteristics of the NCR 1105 memory. Author
- Computer Hardware