Development of High Temperature Multiproperty Apparatus
Progress rept. 1 Jan-30 Jun 1970
THERMOPHYSICAL AND ELECTRONIC PROPERTIES INFORMATION ANALYSIS CENTER LAFAYETTE IN
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The development of the multiproperty apparatus to include high temperature determinations of specific heat, enthalpy and thermal diffusivity in addition to the properties already measured is described. The latter properties include thermal conductivity, electrical resistivity. Lorenz ratio, total hemispherical emittance, spectral emittance at 0.65 microns and thomson coefficient. The specific heat determination involves small transients from an established steady-state temperature. The accuracy and reproducibility of the specific heat determination is controlled by the accuracy obtained in measuring the rate of change of temperature. When photographing an oscilloscopic trace of an automatic pyrometer output, the inaccuracy was about 8 percent. By using a digital data acquisition system, it is believed that data accurate within 1 percent can be achieved at high temperatures.
- Test Facilities, Equipment and Methods