Accession Number:

AD0781494

Title:

Deposition Profiles by Vaporization Expansion Wave Method.

Descriptive Note:

Technical rept. Jun 72-Jun 73,

Corporate Author:

BALLISTIC RESEARCH LABS ABERDEEN PROVING GROUND MD

Personal Author(s):

Report Date:

1974-04-01

Pagination or Media Count:

30.0

Abstract:

A scheme is presented for measurement of deposition profiles in electrically conducting materials, effective in an energy range in which the material is in the mixed liquid-vapor state. An oscillographic record of sensor resistance may be made to yield a plot of deposited energy as a function of depth in the sensor by use of a slow, vaporization-expansion wave model. The results of tests in copper and aluminum sensors are shown and steps to improve accuracy are discussed. Author

Subject Categories:

  • Metallurgy and Metallography

Distribution Statement:

APPROVED FOR PUBLIC RELEASE