Integrated Circuit Reliability Prediction and Complexity Models.
POLYTECHNIC INST OF NEW YORK BROOKLYN DEPT OF ELECTRICAL ENGINEERING AND ELECTROPHYSICS
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A method for calculating the average hazard rate for a catastrophic failure test using the test duration, the number of failures, and the sample population, is shown. If the number of failures is much less than the sample population, the failure rate can be approximated by the number of failures divided by the product of the sample population and the test duration. A equivalency criterion is developed that allows a transformation between hazard model shapes. The model shapes examined in detail are the constant, the Weibull, and the piecewise linear shapes. It is shown that significant errors in reliability can result from assuming a constant hazard. The principal failure modes of digital integrated circuits are examined, and they are related to the complexity of the circuit by qualitative arguments. The analysis is performed for the TTL 7400 series and the Schottky 74S00 series. It is shown that the hazard function of the integrated circuits is a Weibull function of time with a scale parameter proportional to the number of gates in the devices. Modified author abstract
- Electrical and Electronic Equipment