Accession Number:

AD0781247

Title:

A Device for Measuring Thermoelectric and Thermomagnetic Efficiency of Semiconductors,

Descriptive Note:

Corporate Author:

ARMY FOREIGN SCIENCE AND TECHNOLOGY CENTER CHARLOTTESVILLE VA

Personal Author(s):

• Supostat,S. A.
• Tikhomirov,B. G.

Report Date:

1974-05-03

Pagination or Media Count:

5.0

Abstract:

The authors have designed a device for direct measurement of thermoelectric and thermomagnetic efficiency based on Harmans method and Harmans modified methods respectively, on which preliminary measurements were made. Research in a temperature range of 100-400K are possible.

Descriptors:

• *Semiconductors
• *Test equipment
• Thermoelectricity
• Thermophysical properties
• Magnetic properties
• Translations
• USSR

Subject Categories:

• Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE