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A Device for Measuring Thermoelectric and Thermomagnetic Efficiency of Semiconductors,
ARMY FOREIGN SCIENCE AND TECHNOLOGY CENTER CHARLOTTESVILLE VA
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The authors have designed a device for direct measurement of thermoelectric and thermomagnetic efficiency based on Harmans method and Harmans modified methods respectively, on which preliminary measurements were made. Research in a temperature range of 100-400K are possible.
APPROVED FOR PUBLIC RELEASE