Pulse Power Studies of Hardened Microcircuits.
Final rept. Nov 71-May 73,
TEXAS INSTRUMENTS INC DALLAS
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A study was made of the effects of large amplitude transient pulses on radiation tolerant integrated circuits. Two distinct burnout mechanisms exist, diode failure and resistor burnout. Both mechanisms were investigated independently by test structures to measure the influence of processing variations on the failure levels. Modified author abstract
- Electrical and Electronic Equipment