A Study of Electronics Radiation Hardness Assurance Techniques. Volume II, Part 3. Electrical Screening for Second Breakdown.
Final rept. 31 Jul 70-16 Jul 73,
BOEING CO SEATTLE WASH
Pagination or Media Count:
The objectives of the second breakdown SB program were to determine analytical dependences for IC and power transistor SB susceptibility in neutron and gamma ray environments and to investigate means of prediction of SB in a radiation environment through nondestructive screening methods.
- Electrical and Electronic Equipment
- Manufacturing and Industrial Engineering and Control of Production Systems