Accession Number:

AD0777187

Title:

A Study of Electronics Radiation Hardness Assurance Techniques. Volume II, Part 3. Electrical Screening for Second Breakdown.

Descriptive Note:

Final rept. 31 Jul 70-16 Jul 73,

Corporate Author:

BOEING CO SEATTLE WASH

Report Date:

1974-01-01

Pagination or Media Count:

130.0

Abstract:

The objectives of the second breakdown SB program were to determine analytical dependences for IC and power transistor SB susceptibility in neutron and gamma ray environments and to investigate means of prediction of SB in a radiation environment through nondestructive screening methods.

Subject Categories:

  • Electrical and Electronic Equipment
  • Manufacturing and Industrial Engineering and Control of Production Systems

Distribution Statement:

APPROVED FOR PUBLIC RELEASE