A Study of Electronics Radiation Hardness Assurance Techniques. Volume II, Part 1. Electrical Screening for Neutron Effects.
Final rept. 31 Jul 70-16 Jul 73,
BOEING CO SEATTLE WASH
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The report describes the results of a comprehensive study which was designed to determine improved techniques for providing radiation hardness assurance on modern electronic systems. The electrical screening approach examined correlations between certain initial electrical parameters and the radiation sensitivities of the devices. The correlation parameters were selected on the basis of physical reasoning and the radiation sensitivites were defined differently for the various radiation environments. Neutron hardness assurance is treated first and the various classes of devices such as low-power transistors, high-power transistors, JFETs and ICs are discussed separately.
- Electrical and Electronic Equipment
- Manufacturing and Industrial Engineering and Control of Production Systems