Accession Number:

AD0776026

Title:

A Study of Electronics Radiation Hardness Assurance Techniques. Volume I. Background, Approach, and Summary of Results.

Descriptive Note:

Final rept. 31 Jul 70-16 Jul 73,

Corporate Author:

BOEING CO SEATTLE WASH

Personal Author(s):

• Arimura,I.

Report Date:

1974-01-01

Pagination or Media Count:

150.0

Abstract:

The report describes the results of a comprehensive study which was designed to determine improved techniques for providing radiation hardness assurance on modern electronic systems. The two basic goals considered were 1 to determine from physical reasoning and large scale testing the effectiveness of established electrical screening parameters and the existence of additional ones which might be correlated with radiation responses and 2 to establish a statistical comparison between the various hardness assurance techniques including electrical screening, lot sampling and irradiate-and-anneal.

Descriptors:

• *RADIATION HARDENING
• *QUALITY ASSURANCE
• *RELIABILITY(ELECTRONICS)
• ELECTRONIC EQUIPMENT
• RELIABILITY
• SEMICONDUCTOR DEVICES
• TRANSISTORS
• INTEGRATED CIRCUITS
• TRANSIENT RADIATION EFFECTS
• IONIZING RADIATION
• ANNEALING
• IRRADIATION
• FAILURE(ELECTRONICS)

Subject Categories:

• Manufacturing and Industrial Engineering and Control of Production Systems

Distribution Statement:

APPROVED FOR PUBLIC RELEASE