The Analysis of Optical Surface Scattering from Epitaxial Films.
Physical sciences research papers,
AIR FORCE CAMBRIDGE RESEARCH LABS L G HANSCOM FIELD MASS
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An expression has been derived for the transmission of infrared radiation through epitaxial films having a mat surface, which takes into account the scattering at the surface. This has been applied to the analysis of measurements of the fundamental absorption edge of epitaxial films of InAs. The results of this application include the evaluation of the intensity of the scattered light for several InAs films, and good agreement with published values of the absorption coefficient. Author
- Solid State Physics