Measurement of X-Ray Cross Sections Relevant to a Scanning Ion Microscope.
Annual rept. no. 1, 1 Jul 72-30 Jun 73,
MARYLAND UNIV COLLEGE PARK DEPT OF PHYSICS AND ASTRONOMY
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The purpose of the study is to determine the feasibility of using X rays generated by heavy ion-atom collisions as the monitoring signal in an ion microscope. Experimental progress in the design, construction, and operation of an experimental apparatus to measure the rate of X-ray production by heavy ions is described. Particular attention is paid to a new type of soft X-ray spectrometer. Preliminary X-ray cross sections obtained with the described apparatus are presented for 1.0 to 2.5 MeV ions incident upon a thin carbon target. The cross sections are found to increase with ion velocity in the range studied. Modified author abstract
- Test Facilities, Equipment and Methods