Accession Number:

AD0775547

Title:

Measurement of X-Ray Cross Sections Relevant to a Scanning Ion Microscope.

Descriptive Note:

Annual rept. no. 1, 1 Jul 72-30 Jun 73,

Corporate Author:

MARYLAND UNIV COLLEGE PARK DEPT OF PHYSICS AND ASTRONOMY

Report Date:

1973-10-26

Pagination or Media Count:

41.0

Abstract:

The purpose of the study is to determine the feasibility of using X rays generated by heavy ion-atom collisions as the monitoring signal in an ion microscope. Experimental progress in the design, construction, and operation of an experimental apparatus to measure the rate of X-ray production by heavy ions is described. Particular attention is paid to a new type of soft X-ray spectrometer. Preliminary X-ray cross sections obtained with the described apparatus are presented for 1.0 to 2.5 MeV ions incident upon a thin carbon target. The cross sections are found to increase with ion velocity in the range studied. Modified author abstract

Subject Categories:

  • Test Facilities, Equipment and Methods
  • Crystallography

Distribution Statement:

APPROVED FOR PUBLIC RELEASE