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The Structure of Non-Crystalline Materials
Final rept. 4 Feb 1971-31 Dec 1973
BOEING CO SEATTLE WA
Pagination or Media Count:
The primary purpose of this research was to develop the phenomenon of extended x-ray absorption fine structure EXAFS as a technique for investigating the structure of non-crystalline materials, particularly amorphous semiconductors. The EXAFS work on amorphous semiconductors was continued on GeSe, GeSe2, As2Se3, As2S3, and As2Te3. Accompanying this final report are three papers describing the EXAFS experimental and data analysis techniques.
APPROVED FOR PUBLIC RELEASE