Accession Number:

AD0774895

Title:

The Structure of Non-Crystalline Materials

Descriptive Note:

Final rept. 4 Feb 1971-31 Dec 1973

Corporate Author:

BOEING CO SEATTLE WA

Personal Author(s):

• Lytle, Farrel W.

Report Date:

1973-12-31

Pagination or Media Count:

62.0

Abstract:

The primary purpose of this research was to develop the phenomenon of extended x-ray absorption fine structure EXAFS as a technique for investigating the structure of non-crystalline materials, particularly amorphous semiconductors. The EXAFS work on amorphous semiconductors was continued on GeSe, GeSe2, As2Se3, As2S3, and As2Te3. Accompanying this final report are three papers describing the EXAFS experimental and data analysis techniques.

Descriptors:

• *AMORPHOUS MATERIALS
• *CRYSTAL STRUCTURE
• *SEMICONDUCTORS
• ARSENIC COMPOUNDS
• GERMANIUM COMPOUNDS
• SELENIDES
• SULFIDES
• TELLURIDES
• X RAY ABSORPTION ANALYSIS

Subject Categories:

• Crystallography
• Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE