Accession Number:

AD0774676

Title:

Behavior of Injection Locked IMPATT and Free Running TRAPATT Oscillators under Transient Ionizing Radiation.

Descriptive Note:

Final rept. 1 Dec 71-30 Jun 73,

Corporate Author:

RENSSELAER POLYTECHNIC INST TROY N Y DIV OF ELECTROPHYSICS AND ELECTRONIC ENGINEERING

Personal Author(s):

• Chandhi,Sorab K.
• Borrego,Jose M.
• Gutman,Ronald J.
• Geipel,Henry J.

Report Date:

1973-11-01

Pagination or Media Count:

38.0

Abstract:

X-band injection locked IMPATT oscillators were exposed to 100-nanosecond pulses of 10 MeV electrons at dose rates between 3 x 10 to the 8th power and 3 x 10 to the 9th power radssec. During the radiation pulse, the RF power of the oscillator was found to be independent of the locking signal while the RF frequency shift depended upon the power of the locking signal. Original performance was regained within a few RF cycles following the radiation pulse. S-band TRAPATT diode pulsed oscillators were exposed to 100 nanoseconds pulses of 10 MeV electrons at dose rates between 2 x 10 to the 7th power and 4 x 10 to the 9th power radsec in both evacuated and air-filled cavities. The RF power is unaffected below a critical dose rate, which is typically between 8 x 10 to the 7th power and 2 x 10 to the 8th power radssec. Above this critical dose rate the RF power is almost quenched entirely during the radiation pulse, but recovers to the original level within 50 nanoseconds afterwards for all dose rates used. Rapid recovery of original RF power levels occurred when the radiation pulse occurred at the initiation of the 300 nanosecond RF TRAPATT pulse, in the middle of the TRAPATT pulse, or during the decay of the TRAPATT pulse. Author

Descriptors:

• *Microwave oscillators
• *Transient radiation effects
• *Avalanche diodes
• *IMPATT diodes
• X band
• S band
• Electron irradiation

Subject Categories:

• Electrical and Electronic Equipment
• Radioactivity, Radioactive Wastes and Fission Products

Distribution Statement:

APPROVED FOR PUBLIC RELEASE