Accession Number:

AD0773502

Title:

Ellipsometric Examination of Passive Layers.

Descriptive Note:

Final rept.,

Corporate Author:

PENNSYLVANIA UNIV PHILADELPHIA DEPT OF CHEMISTRY

Personal Author(s):

Report Date:

1973-12-17

Pagination or Media Count:

31.0

Abstract:

Studies covering 1 the effect of electromodulation upon ellipsometric measurements of adsorption in the double layer and 2 the ellipsometric measurement of thickness and optical properties of a thin light absorbing film have resulted in a method for ellipsometric measurement which avoids the necessity for auxiliary measurement. Author

Subject Categories:

  • Physical Chemistry
  • Metallurgy and Metallography

Distribution Statement:

APPROVED FOR PUBLIC RELEASE