Ellipsometric Examination of Passive Layers.
PENNSYLVANIA UNIV PHILADELPHIA DEPT OF CHEMISTRY
Pagination or Media Count:
Studies covering 1 the effect of electromodulation upon ellipsometric measurements of adsorption in the double layer and 2 the ellipsometric measurement of thickness and optical properties of a thin light absorbing film have resulted in a method for ellipsometric measurement which avoids the necessity for auxiliary measurement. Author
- Physical Chemistry
- Metallurgy and Metallography