Accession Number:

AD0768751

Title:

Susceptibility of Semiconductor Devices to Thermal Second Breakdown,

Descriptive Note:

Corporate Author:

NAVAL ORDNANCE LAB WHITE OAK MD

Personal Author(s):

Report Date:

1973-03-21

Pagination or Media Count:

27.0

Abstract:

A method for determining the susceptibility of semiconductor devices to damage from an electromagnetic pulse EMP due to induced thermal second breakdown is described. The method can be used as a nondestructive screening test. It is based on the increase in junction reverse breakdown voltage with temperature and can be used to find the most EMP resistant devices of a given type. A mathematical explanation is presented, and other tentative applications are proposed. Author

Subject Categories:

  • Electrical and Electronic Equipment

Distribution Statement:

APPROVED FOR PUBLIC RELEASE