Accession Number:
AD0768088
Title:
Forbidden Si (442) Structure Factor.
Descriptive Note:
Technical rept.,
Corporate Author:
WATERVLIET ARSENAL N Y
Personal Author(s):
Report Date:
1973-09-01
Pagination or Media Count:
15.0
Abstract:
A recent measurement by Trucano and Batterman of the forbidden Si 442 x-ray structure factor prompted the author to calculate this value by using a simple model for the electronic charge distribution with parameters determined from a given set of allowed formfactors. For the allowed formfactor experimental values of Raccah et al were used. For T OK it was found that F442 0.082 plus or minus 0.010, compared to Trucano and Battermans bond value of 0.089 plus or minus 0.007 converted to T OK. Modified author abstract
Subject Categories:
- Crystallography
- Solid State Physics