Accession Number:

AD0768088

Title:

Forbidden Si (442) Structure Factor.

Descriptive Note:

Technical rept.,

Corporate Author:

WATERVLIET ARSENAL N Y

Personal Author(s):

Report Date:

1973-09-01

Pagination or Media Count:

15.0

Abstract:

A recent measurement by Trucano and Batterman of the forbidden Si 442 x-ray structure factor prompted the author to calculate this value by using a simple model for the electronic charge distribution with parameters determined from a given set of allowed formfactors. For the allowed formfactor experimental values of Raccah et al were used. For T OK it was found that F442 0.082 plus or minus 0.010, compared to Trucano and Battermans bond value of 0.089 plus or minus 0.007 converted to T OK. Modified author abstract

Subject Categories:

  • Crystallography
  • Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE