Forbidden Si (442) Structure Factor.
WATERVLIET ARSENAL N Y
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A recent measurement by Trucano and Batterman of the forbidden Si 442 x-ray structure factor prompted the author to calculate this value by using a simple model for the electronic charge distribution with parameters determined from a given set of allowed formfactors. For the allowed formfactor experimental values of Raccah et al were used. For T OK it was found that F442 0.082 plus or minus 0.010, compared to Trucano and Battermans bond value of 0.089 plus or minus 0.007 converted to T OK. Modified author abstract
- Solid State Physics