Combined Ellipsometric and Soft X-Ray Spectroscopic Studies of Corrosion Processes on Transparent Materials.
PENNSYLVANIA STATE UNIV UNIVERSITY PARK MATERIALS RESEARCH LAB
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The feasibility of carrying out systematic and precise surface characterization studies on transparent materials by ellipsometry has been established. Specifically, it is shown that one can detect and quantitatively measure the extent of the damaged surface layers on such transparent materials. Similarly, it is shown that the soft x-ray spectroscopic method can be used to characterize the contaminant film on any material even though the film may be compositionally inhomogeneous. Author
- Ceramics, Refractories and Glass