Research in Ferromagnetics: Domain Tip Devices.
Final rept. 1 Jan-31 Dec 72,
CAMBRIDGE MEMORIES INC NEWTONVILLE MASS MAGNETIC THIN FILM DEVELOPMENT DEPT
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The design and operation of the DOT blocking type shift register is described and the results of tip blocking experiments presented. An electronic technique for determining the position of a channel defect is discussed. Defect size is also considered. Aluminum underlayer studies were performed with an optical instrument called the 3Aluminum Measuring Instrument3 AMI. The effect of process chemicals on aluminum films was also studied. An optical magnetic film thickness measurement technique is described. A general comparison of the DOT and other storage technologies is presented. The DOT and Bubble are examined in more detail. DOT shift register techniques are described. These include input and output multiplexing and NDRO shift registers. Author
- Computer Hardware
- Solid State Physics